Thematic Workshop: “Present and Future of SEE Testing: Facilities and Methodologies”
Technical sessions chaired by the Technical Committee:
- SEE mechanisms and modelling
- SEE in devices & ICs
- Basic mechanisms
- Radiation effects in devices & ICs
- Radiation environments
- Dosimetry & facilities
- Radiation hardening techniques
- Photonics, optoelectronics and sensors
- Radiation hardness assurance
- Radiation effects in complex devices & systems
- Data workshop
Other technical programs during the conference:
- Industrial Exhibition
- Women at research and engineering
- Invited talks
- Scientific and technical visits
Social events during the conference:
- Welcome Reception
- Exhibitor Reception
- Football Tournament
- Gala Dinner
Please note that the conference program is subject to change, and will be updated continuously up to the conference!